Archive for the ‘fab’ Category
Monday, January 12th, 2009
Rudolph Technologies today announces Discover Solar™—the first fab management software tool designed specifically to help photovoltaic (PV) manufacturers increase cell efficiency and reduce costs. Discover Solar accepts all available data from each step in the solar manufacturing process, and then applies statistical process control (SPC) algorithms to generate automated reports. A company spokesperson confirmed that […]
Rudolph’s PV fab management software
Tags: control, excursion, fab, management, MES, PV, quality, software, SPC, yield
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Friday, January 9th, 2009
SolFocus, the Mountain View, California developer of Concentrator Photovoltaic (CPV) systems, today announced that it has raised $47.5 million in the first close of its Series C financing and appointed Mark Crowley chief executive officer. Crowley, who was named president of SolFocus in August 2008, will assume the role of CEO, while previous CEO and […]
SolFocus gets new money and new CEO
Tags: 150mm, concentrator, CPV, Ge, III-V, LCOE, MOCVD, PV, solar, SolFocus, Spectrolab
Posted in Equipment, fab, Product, PV | Comments Off on SolFocus gets new money and new CEO
Thursday, January 8th, 2009
Samsung has launched a new press release for “super-thin LED monitors” (http://www.businesswire.com/news/home/20090107006252/en) that are really LCDs with LED backlight units (BLU). The company’s new P2370L is just 16.5mm thick and uses white LED instead of cold cathode fluorescent lamp (CCFL) illumination. Compared to CCLF units, LED BLUs consume 30% less energy, are constructed without mercury, […]
Samsung LED backlighting proliferates
Tags: backlight, BLU, FPD, InGaN, LCD, LED, lighting, MOCVD, Osram, Samsung
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Wednesday, January 7th, 2009
On January 6, 2009, ASM International and SAFC Hitech (a business segment within SAFC, a member of the Sigma-Aldrich Group) announced that they have entered into a certified manufacturer and partnership agreement for ALD precursors for barium- and strontium-based high-k insulators. The agreement includes certification criteria, a license to certain ASM ALD patents, and a […]
ASM and SAFC Hitech to work on Ba and Sr ALD
Tags: 32nm, ALD, CMOS, cyclopentadienyl, DRAM, high-k, HK, IC, MOCVD, precursor
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Tuesday, January 6th, 2009
The first issue of the BetaSights Newsletter has been published (see link to a free copy in the right-side column of this page under “Newsletters”), and a reader has already provided a correction. Michael Current (San Jose, California) noticed that the initial web-link to the slides from Prof. Asenov’s IEDM 2008 variability presentation was incorrect; […]
Very variable transistors
Tags: CMOS, IC, node, scaling, shrink, variability
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Monday, January 5th, 2009
FSI International, Inc. (Nasdaq: FSII) announced December 23, 2008 that it has received an order for it’s new ORION® single wafer cleaning platform after a beta evaluation by a major semiconductor manufacturer. The tool will be used for resist strip in 32nm metal interconnect modules, using FSI’s proprietary “ViPR” extension of the classic “piranha” (a.k.a., […]
FSI cleaning tool exits beta with payment
Tags: 32nm, beta, clean, interconnect, Semiconductor, single-wafer, SPM, ViPR
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Sunday, January 4th, 2009
This is the first example of a posting to BetaSights new BetaBlog. New posts will appear most working days, so bookmark this site and check back regularly. BetaSights was founded in the fall of 2008 by industry veterans Ed Korczynski and Elizabeth Schumann, to provide commercial free, member supported, productive info about fab beta sites. […]
Welcome to the beginning of BetaBlog(SM)
Tags: Equipment, fab, FPD, IC, materials, MEMS, PV, Service
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