Archive for the ‘PV’ Category
Monday, March 30th, 2009
The principles of “causality” and “boundary conditions” are fundamental to modern science, and when you apply these principles to the system of human energy production/consumption it tends to lead to thoughts of TeraWatt Challenges and limiting demand. Raw energy limits need not equate with lifestyle limits, if new technologies allow us to be far more […]
World thinks about Earth for one hour
Tags: PV
Posted in FPD, IC, MEMS, PV | Comments Off on World thinks about Earth for one hour
Tuesday, March 24th, 2009
It is always sunrise somewhere on our spinning sphere, and the sun is always changing too (see figure). There are always ups and downs in our world, and we learn to “make hay while the sun shines.” Where has the sun been shining lately? Photovoltaic (PV) and MEMS industries have continued to grow lately, as […]
Always sunrise somewhere
Tags: CIGS, fab, MEMS, PV
Posted in Equipment, fab, MEMS, Product, PV | Comments Off on Always sunrise somewhere
Monday, March 23rd, 2009
Keithley Instruments has been very busy extending the capabilities of it’s 4200-SCS (Semiconductor Characterization System) with new cables for IC measurements and new software libraries for PV, OLED, and other devices. The 4200-SCS replaces a variety of electrical test tools with a single integrated characterization solution, and works for applications including semiconductor technology development, process […]
Keithley 4200-SCS upgrades
Tags: C-V, characterization, FPD, I-V, IC, OLED, prober, PV, Semiconductor, test
Posted in Equipment, fab, FPD, IC, MEMS, Product, PV | Comments Off on Keithley 4200-SCS upgrades
Wednesday, March 18th, 2009
Wright Williams & Kelly (WWK), the cost and productivity modeling company, is now providing free general information in an electronic newsletter, and has lowered the cost to start using it’s flagship TWO COOL(R) cost of ownership (CoO) modeling software. The company’s “Applied Cost Modeling” newsletter features free excerpts from the book “Hi-Tech Equipment Reliability: A […]
WWK cost modeling tools
Tags: CoO, fab, FPD, IC, MEMS, model, OEE, PV
Posted in fab, FPD, IC, MEMS, Product, PV, Service | Comments Off on WWK cost modeling tools
Friday, March 13th, 2009
Trust is the foundation of all trade and business. Without trust, no deal can get done, no venture can be launched, no discussion can even begin. Trust has been shaken in individual businesses in recent years, but recently exposed financial scams have shaken confidence not just in one or a collection of companies but almost […]
Trust your fab – CDO vs CDO
Tags: CDO, fab, FPD, IC, MEMS, PV, R&D
Posted in fab, FPD, IC, MEMS, PV | Comments Off on Trust your fab – CDO vs CDO
Thursday, March 12th, 2009
Stangl Semiconductor Equipment has launched its Linea horizontal inline wet process platform for cleaning and etching of crystalline silicon PV wafers. The fully-automated dry-in/dry-out system offers reliable production capacity of up to 3,400 wafers per hour (wph) corresponding to an estimated 60 MW per line running 156mm wafers. The system can also be configured at […]
Stangl inline PV wet tool
Tags: chemical, clean, etch, inline, PV, Si, wet
Posted in Equipment, fab, Product, PV | Comments Off on Stangl inline PV wet tool
Tuesday, March 10th, 2009
Bob Metcalfe is very smart, very successful, and very rich. Now an unashamed venture capitalist investing in both PV and home nuclear as part of his diversified portfolio, his major vision is for a new “enernet” that would fundamentally revolutionize the energy industry. He spoke of this as well as his invention of Ethernet this […]
Metcalfe envisions energy net
Tags: net, PV
Posted in IC, PV | Comments Off on Metcalfe envisions energy net
Monday, March 9th, 2009
SVTC Technologies has been busy announcing new business directions ever since Joe Bronson stepped in as CEO at the beginning of this year. Last month it announced a partnership with Entrepix to provide 300 mm chemical mechanical polishing (CMP) development and production services for customers who use the Tool Access Program (TAP) at the SVTC […]
SVTC provides analytical services
Tags: AFM, analysis, EELS, FIB, IC, materials, MEMS, SEM, SIMS, TEM
Posted in fab, FPD, IC, MEMS, Product, PV, Service | Comments Off on SVTC provides analytical services
Friday, March 6th, 2009
Veeco announced yesterday that it has entered into a strategic partnership with Daiyang Metal of Korea, a leader in the production of cold rolled stainless steel, to be its supplier of equipment to manufacture CIGS solar cells. As a first milestone in this relationship, Daiyang has placed an initial multi-million dollar purchase order with Veeco […]
Veeco and Daiyang partner for R2R CIGS PV
Tags: CIGS, Mo, PV, R2R, solar, TCO, thin-film
Posted in Equipment, fab, Product, PV | Comments Off on Veeco and Daiyang partner for R2R CIGS PV
Wednesday, February 25th, 2009
Applied Materials’ Technical Symposium at SPIE 2009 featured a panel discussion on next generation lithography (NGL) that was moderated by the company’s Ken MacWIlliams. The outstanding panelists were C. Grant Willson (UT-Austin), Burn Lin (TSMC), Jongwook Kye (AMD), Steve Radigan (Sandisk), and Milind Weling (Cadence). As would be expected from this panel, EUV steppers were […]
IC next-generation litho needs all possible tricks
Tags: DP, EbDR, i193, litho, NIL, stepper
Posted in Equipment, fab, IC, Material, MEMS, Product, PV, Service | Comments Off on IC next-generation litho needs all possible tricks