Wednesday, January 27th, 2010
… and after years of tribulation with most people gone to other lands, a great fear was upon the land of Publishing for all business models were lost along with all hope. The web had washed so much away, and the multitudes prayed that the one true Jobs would intervene and with compassion bestow upon […]
Praying for Jobs ex machina
Tags: info, value
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Friday, January 22nd, 2010
The IEEE’s International Electron Devices Meeting (IEDM) is still the place to see the latest micro- and nano-electronics research targeting commercial markets. On December 8, 2009, French researchers from Leti/Minatec showed “3D sequential CMOS integration” as <600°C processing of PFETs using a (110) orientation FDSOI layer that was transferred on top of NFETs made using […]
Leti shows 3D IC PFETs over NFETs
Tags: 22nm, 3D, dual-gate, epitaxy, FDSOI, FET, finFET, HfO2, HK, IC, NiSi, R&D, RSD, selective epi, SiGe, SPE, stack, TSV
Posted in fab, IC | Comments Off on Leti shows 3D IC PFETs over NFETs