Wednesday, March 25th, 2009
Novaled, the provider of Organic Light Emitting Diode (OLED) technology and materials, and Holst Centre, an independent R&D centre developing generic technologies for Wireless Autonomous Transducer Solutions and for Systems-in-Foil, have decided to collaborate on the development of organic thin film transistor (OTFT) technologies under a joint development agreement. Novaled will provide its organic dopants […]
Novaled and Holst Centre JDA on OTFT
Tags: CMOS, dopant, IC, Material, OLED, organic, OTFT, TFT
Posted in fab, FPD, IC, Material, Product | Comments Off on Novaled and Holst Centre JDA on OTFT
Monday, March 23rd, 2009
Keithley Instruments has been very busy extending the capabilities of it’s 4200-SCS (Semiconductor Characterization System) with new cables for IC measurements and new software libraries for PV, OLED, and other devices. The 4200-SCS replaces a variety of electrical test tools with a single integrated characterization solution, and works for applications including semiconductor technology development, process […]
Keithley 4200-SCS upgrades
Tags: C-V, characterization, FPD, I-V, IC, OLED, prober, PV, Semiconductor, test
Posted in Equipment, fab, FPD, IC, MEMS, Product, PV | Comments Off on Keithley 4200-SCS upgrades